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Technical library

Open the guide, then the series.

The guide names the surface and the series. Send the part from that page.

Machine vision lighting reference
Selection guidance begins with the inspection condition.
Selection Guides

Which technical articles and selection guides fit your topic?

Showing 25-36 of 85 articles, page 3 of 8.

UV fibre illumination and fluorescence screening
Selection

UV fibre illumination and fluorescence screening

First test whether the material fluoresces under the selected UV band. Then separate excitation light from fluorescence with suitable filtering.

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LXV-4LINV passively cooled line lighting
Selection

LXV-4LINV passively cooled line lighting

Leave adequate cooling space around passive line lights. Check ambient temperature and sustained output rather than cold-start brightness alone.

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Light size and inspection field of view
Selection

Light size and inspection field of view

Use the effective emitting area rather than housing size. Allow for part-position variation and fixture obstruction.

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Separate colour capture and mixed fibre illumination
Selection

Separate colour capture and mixed fibre illumination

Fix capture order and verify synchronisation for separate colours. For mixed light, record channel ratios for repeatable illumination.

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Diffuse lighting for square workpieces
Selection

Diffuse lighting for square workpieces

Square-part corners may sit at different distances from the light. Check corners after rotation and height changes, not only the centre.

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Component matching in SWIR fibre systems
Selection

Component matching in SWIR fibre systems

Camera, lens, fibre and filters must support the target SWIR band. Any component can limit the available signal.

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Zoned illumination and directional separation
Selection

Zoned illumination and directional separation

Check part movement and trigger order during zoned captures. Images from different directions must remain spatially aligned.

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Combining lighting for semiconductor inspection
Selection

Combining lighting for semiconductor inspection

Separate markings, outlines, bond wires and surface defects into distinct tasks before deciding which lighting arrangements can share a station.

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Special geometries and combined illumination
Selection

Special geometries and combined illumination

Sketch the camera, part and fixture light paths before choosing special geometries. Check interference between combined light sources.

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LXV-LBR diffuse bar illumination
Selection

LXV-LBR diffuse bar illumination

Diffuse bars soften reflections but may reduce fine-scratch contrast. Evaluate the background and the defect together.

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Beverage cap openings and sealing areas
Selection

Beverage cap openings and sealing areas

Cap openings, liners and inner walls require different viewing depths. Check shadowing from the rim and fixture.

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LXV-LDLB bar lights with integrated control
Selection

LXV-LDLB bar lights with integrated control

Verify power, trigger logic and brightness storage for integrated-control bars. Test their state after a power cycle.

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How are the technical library categories organized?

Each topic category targets a specific stage of optical system design. Use the summary table below to locate the right engineering notes.

CategoryEngineering ScopeArticles & Guides
Machine Vision LightingLight geometry, wavelength, diffusion, line-scan, backlight, coaxial, and fiber lighting notes.5
Cameras & LensesIndustrial cameras, lenses, focusing, depth of field, imaging parameters, and optical fundamentals.8
Inspection ApplicationsDefect detection examples for semiconductor, automotive, electronics, packaging, and surface inspection.69
Controllers & IntegrationController modes, trigger timing, system integration, and production-line implementation notes.1
Selection GuidesPractical selection methods for lighting, cameras, lenses, accuracy, and machine vision architecture.85
Company NewsCompany updates, product announcements, and editorial news items.26
Questions

What questions help frame the discussion?

What can I find in the LuxMV article library?

The library contains machine vision lighting notes, selection guidance, inspection application examples, controller integration topics, and company updates.

Can an article replace sample testing?

No. Articles provide selection context; final lighting choices work well when compared with the actual workpiece, camera, lens, and production conditions.