What can I find in the LuxMV article library?
The library contains machine vision lighting notes, selection guidance, inspection application examples, controller integration topics, and company updates.
Technical library
Open the guide, then the series.
The guide names the surface and the series. Send the part from that page.
Article library
Which technical articles and selection guides fit your topic?
Showing 1-12 of 194 articles, page 1 of 17.
Selection
Battery tab edges and film outlines
Sample tab burrs and transparent film edges separately. Check whether exposure or part height shifts the detected edge.
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Selection
Filter switching for multiband fibre illumination
After changing filters, recheck exposure, focus and field uniformity. Raw brightness values from different bands are not directly comparable.
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Selection
Wafer chips, cracks and scratches
Edge chips, surface scratches and internal cracks may require different viewing directions. One image cannot validate every defect class.
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Selection
SWIR inspection of chip packaging
Test transmission through the actual packaging material before evaluating internal structures. Visually similar packages can behave differently in infrared.
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Selection
Weld and assembly inspection on motor rotors
Define separate criteria for rotor welds, slots and assembly position. Test reflections as the rotor turns.
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LXV-2SLG RGB fibre illumination
Capture red, green and blue channels separately with fixed camera settings. Distinguish colour discrimination from surface-direction information.
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Choosing laser-coupled fibre illumination
Check fibre interfaces, speckle and output uniformity in laser-coupled systems. Follow the equipment instructions for optical protection.
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Selection
Tunnel line lighting in confined spaces
Check feed clearance, camera aperture and service access in confined installations. Housing dimensions alone do not determine fit.
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Selection
Striped illumination for surface deformation
Record the normal pattern on a good part, then compare local displacement. Separate dents from printing and normal curvature.
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Selection
Comparing lighting for brake disc surfaces
Machining marks can resemble brake-disc scratches. Rotate samples under several lighting directions and record normal texture variation.
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Selection
Testing infrared transmission in semiconductor materials
Transmission trials should cover thickness, doping and coatings. Material names alone do not establish infrared transparency.
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Selection
Wire surface and appearance inspection
Wire curvature and lateral movement change reflections. Inspect the full surface under representative motion conditions.
Read articleHow are the technical library categories organized?
Each topic category targets a specific stage of optical system design. Use the summary table below to locate the right engineering notes.
| Category | Engineering Scope | Articles & Guides |
|---|---|---|
| Machine Vision Lighting | Light geometry, wavelength, diffusion, line-scan, backlight, coaxial, and fiber lighting notes. | 5 |
| Cameras & Lenses | Industrial cameras, lenses, focusing, depth of field, imaging parameters, and optical fundamentals. | 8 |
| Inspection Applications | Defect detection examples for semiconductor, automotive, electronics, packaging, and surface inspection. | 69 |
| Controllers & Integration | Controller modes, trigger timing, system integration, and production-line implementation notes. | 1 |
| Selection Guides | Practical selection methods for lighting, cameras, lenses, accuracy, and machine vision architecture. | 85 |
| Company News | Company updates, product announcements, and editorial news items. | 26 |
Questions
What questions help frame the discussion?
Can an article replace sample testing?
No. Articles provide selection context; final lighting choices work well when compared with the actual workpiece, camera, lens, and production conditions.