What can I find in the LuxMV article library?
The library contains machine vision lighting notes, selection guidance, inspection application examples, controller integration topics, and company updates.
Technical library
Open the guide, then the series.
The guide names the surface and the series. Send the part from that page.
Article library
Which technical articles and selection guides fit your topic?
Showing 49-60 of 194 articles, page 5 of 17.
Selection
Matching the illuminated spot with LXV-HL
Spot matching involves edge falloff and central hotspots as well as diameter. Test at the actual working distance.
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Selection
Checking full-width uniformity with LXV-4LINS
Sample the entire useful line at one exposure. Pay attention to ends, joins and mounting obstructions.
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Selection
Collimated spot lighting in vial inspection
Separate vial-wall features from particles in liquid. Fix rotation and capture timing before comparing illumination arrangements.
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Selection
Installation conditions for precision coaxial lighting
Check the relative position of lens front, viewing aperture and part plane. Assembly offsets can create an uneven background.
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Selection
Integrating LXV-3LINR into line-scan systems
Place the scan line inside the useful light band. Then check synchronisation and image proportions as speed changes.
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Selection
Inspecting glass bottle walls, mouths and bases
Bottle walls, mouths and bases differ in curvature and thickness. Use appropriate views to prevent refracted highlights hiding defects.
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Selection
Getting started with LuxMV vision lighting
Start with the target defect, material and cycle time. Select the lighting geometry before size, colour and controller.
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Selection
Material screening with SWIR illumination
Compare visible and SWIR captures side by side. Record actual changes in transmission, absorption and surface reflection.
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Selection
Coin scratches, relief and lettering
Normal coin relief and scratches can both form bright lines. Compare good samples under several lighting directions.
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Selection
Comparing light on wafers and chips
Wafer marks, chip surfaces and edge chips may need different light paths. Compare coaxial and oblique illumination for each task.
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Selection
Revealing scratches along the travel direction
A single line-light direction can weaken long travel-aligned scratches. Rotate the illumination and inspect scratch continuity.
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Selection
Cooling and working distance with LXV-4LIN
Working distance changes both band width and sample brightness. Recheck thermal conditions and exposure margin after adjustment.
Read articleHow are the technical library categories organized?
Each topic category targets a specific stage of optical system design. Use the summary table below to locate the right engineering notes.
| Category | Engineering Scope | Articles & Guides |
|---|---|---|
| Machine Vision Lighting | Light geometry, wavelength, diffusion, line-scan, backlight, coaxial, and fiber lighting notes. | 5 |
| Cameras & Lenses | Industrial cameras, lenses, focusing, depth of field, imaging parameters, and optical fundamentals. | 8 |
| Inspection Applications | Defect detection examples for semiconductor, automotive, electronics, packaging, and surface inspection. | 69 |
| Controllers & Integration | Controller modes, trigger timing, system integration, and production-line implementation notes. | 1 |
| Selection Guides | Practical selection methods for lighting, cameras, lenses, accuracy, and machine vision architecture. | 85 |
| Company News | Company updates, product announcements, and editorial news items. | 26 |
Questions
What questions help frame the discussion?
Can an article replace sample testing?
No. Articles provide selection context; final lighting choices work well when compared with the actual workpiece, camera, lens, and production conditions.